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Ok I am reading but I have some doubt
can someone help to understand this topics
scan is techniques used in design for testing
Q1 . how does vlsi circuit scan I mean we need software tool or test equipment to scan VLSI circuit ? Q2 when does we scan circuit after fabrication or before fabrication ?
You need VLSI scanning hardware, often via the JTAG port to do it. You scan AFTER fabrication - else what are you testing ?
ok tanks for help
design for testability is process ensure that design has enough observability and controllability to provide for complete and efficient test built in self test - capability of circuit to test itself built in self test circuitry incorporated within chip for self testing test vector ---> original circuit & self test circuitry --> output response scan design - scan is technique used in design for testing test vector ---> original circuit & scan circuitry --> output response Q- how does test vector generate for built in self and scan design I think for scan we use ATPG to generate tset vector does we use ATPG for built in self test Q how does design make testable ? I think we add some flip flop and mux to make testable design Q can someone little bit how does circuit make controllable and observable?
Fault may occur anytime - Design - Process - Package circuit design functional design structural design layout design when we design circuit on software , error can be determine by the simulation vlsi circuit contain additional test circuit like fault modeling stuck at faults Bridging faults Transistor stuck-open faults Delay faults error can be determine by fault simulation we can test circuit to determine fault Q1 what is test generation ? Q2 scan is technique used in design for testing ? Q3 built in self test built in self test method that allow circuit to test their own operation
Oddly, I would think both terms are self explanatory.
Testing any system is invariably a test against the original design specification.
The simple question is does the item do what it is supposed to do. The hard part is having a sufficiently detailed document that actually defines what the item is supposed to do.
Of course with electronic systems it may be necessary to place boundaries around a system element so that external factors do not expand the test field until it gets out of hand.
In general the majority of systems and sub systems are often tested in terms of their inputs and the corresponding outputs. With numerous inputs the testing for combinational problems can quickly get out of hand - this is a case for breaking the system into even smaller sub systems.
In an ideal situation every sub system should have a single function so that its operation can be easily confirmed and multiplex interactions are avoided.
It can be much easier to see where the combinational error is if you are confident in the operation of the individual parts.
I might note that with software this simple procedure is rarely followed. Hence software development tends to be late, none of limited functionality or well over budget, or indeed a combination of all 3.
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